Phase-Contrast and Dark-Field Imaging
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Beschreibung
The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
Autor*in
Simon Zabler
Fraunhofer Development Center X-ray Technology EZRT
Themen in »Phase-Contrast and Dark-Field Imaging«
Coded-aperture imaging Computed Tomography Dark-field imaging Electron Backscatter imaging Fourier image analysis Moiré pattern analysis Talbot-Interferometer X-ray Phase-contrast imaging X-ray scattering cultural heritage image processing medical imaging