21st International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)
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Beschreibung
Selected peer-reviewed extended articles based on abstracts presented at the 21st International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)
Aggregated Book
Selected peer-reviewed extended articles based on abstracts presented at the 21 International Conference on Silicon Carbide and Related Materials (ICSCRM 2024).
Autor*in
Trans Tech Publications Ltd
Themen in »21st International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)«
Anneal Applications Basal Plane Dislocations BJT BPDs Defect Characterization Defects Design Device Physics Diodes Dislocations Edge Termibnation Epitaxy Extended Defects Gate Oxide