Ltd Materials Science Applications of Ion Beam Techniques

Materials Science Applications of Ion Beam Techniques

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Beschreibung

Proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques incorporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 1996


The first particle accelerators were built in the early 1930’s. For a long time, these devices were used exclusively by nuclear physicists. In the 1960’s, extensive developments in measuring techniques occurred, mainly as a result of newly developed semiconductor devices. Further strong interest arose from the semiconductor industry, and ion implantation became widely accepted as being the ultimate tool for Si-based device fabrication.


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Trans Tech Publications Ltd

Themen in »Materials Science Applications of Ion Beam Techniques«

Amorphisation Ceramic Depth-Profiling Diffusion GaAs Heavy Ions High Energy Irradiation Ion Beam Ion Beam Analysis Ion Implantation Molecular Dynamic (MD) Radiation Damage RBS Rutherford Backscattering Rutherford Backscattering Spectrometry

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Details

ISBN: 9783035705201
Verlag: Trans Tech
Erscheinung: 29.05.1997

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