Franz J. Giessibl Giessibl Atomic Force Microscopy and Atomic Manipulation

Atomic Force Microscopy and Atomic Manipulation

von Franz J. Giessibl

An Inquiry into Matter

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Beschreibung

What does it take to see a single atom — or to pick one up and move it? This book takes the reader to the frontier of the very small: atomic force microscopy at its ultimate resolution, force spectroscopy on individual bonds, and the use of the probe tip to manipulate matter atom by atom. It develops both the experimental technique and the underlying theory, examining the origins of interatomic forces and the challenge of measuring them against ubiquitous noise — and the strategies that push the signal-to-noise ratio to its limits.

Many key historical experiments and the pioneers behind them are described, revealing how the founding fathers of nanoscience ventured into territory no one had entered before.


What does it take to see a single atom — or to pick one up and move it? This book takes the reader to the frontier of the very small: atomic force microscopy at its ultimate resolution, force spectroscopy on individual bonds, and the use of the probe tip to manipulate matter atom by atom. It develops both the experimental technique and the underlying theory, examining the origins of interatomic forces and the challenge of measuring them against ubiquitous noise — and the strategies that push the signal-to-noise ratio to its limits.

Many key historical experiments and the pioneers behind them are described, revealing how the founding fathers of nanoscience ventured into territory no one had entered before.


Essential reading for newcomers to the field of Atomic Force Microscopy Authored by a pioneer in the field with wide background ranging from academia to industry Includes fascinating insights into the historical development of this field and its early protagonists

Autor*in

Franz J. Giessibl

Themen in »Atomic Force Microscopy and Atomic Manipulation«

Chemical Bonding Atomic Resolution Subatomic Resolution Ultralow Forces qPlus Sensor Van Der Waals Forces Imaging Artifacts Research Approaches Nobel laureates Atomic Force Microscopy Force Sensing Exchange Forces Pauli Repulsion

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Details

ISBN: 9783032322029
Verlag: Springer International Publishing
Erscheinung: 30.08.2026

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