VLSI Design and Test
29th International Symposium, VDAT 2025, Chandigarh, India, August 7–9, 2025, Proceedings, Part I
Buch in deiner Nähe kaufen
Beschreibung
This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7–9, 2025.
The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.
Autor*in
Brajesh Rawat
Themen in »VLSI Design and Test«
VLSI Design Semiconductor Devices SRAM and Memory Architectures Computing-in-Memory (CIM) Computer-Aided Design (CAD) Hardware Accelerators for AI FPGA-based System Design Deep Neural Networks Hardware Edge AI and Embedded Systems Approximate Computing Machine Learning for Electronic Devices Low-Power Circuit Design RF and Microwave Circuits Analog and Mixed-Signal Circuits Energy-Efficient Processor Architectures