Torsello Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

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Joint IAPR International Workshops, S+SSPR 2024, Venice, Italy, September 9–10, 2024, Revised Selected Papers

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Beschreibung

This book constitutes the proceedings of the Joint IAPR International Workshops on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2024, which took place in Venice, Italy, during September 9-11, 2024.

The 19 full papers presented in this volume were carefully reviewed and selected from 27 submissions. The proceedings focus on pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.


Autor*in

Andrea Torsello

Themen in »Structural, Syntactic, and Statistical Pattern Recognition«

artificial intelligence computer science computer systems computer vision deep learning graph theory image analysis image processing machine learning mathematics neural networks pattern recognition signal processing

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Details

ISBN: 9783031805073
Verlag: Springer International Publishing
Erscheinung: 30.01.2025

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