Single-Event Effects, from Space to Accelerator Environments
Analysis, Prediction and Hardening by Design
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Beschreibung
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.
Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.
- Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
- Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
- Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
- Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
This is an open access book.
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.
Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.
- Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
- Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
- Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
- Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
This is an open access book.
Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
Autor*in
Ygor Quadros de Aguiar
Themen in »Single-Event Effects, from Space to Accelerator Environments«
Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA