Recent Advances in Microelectronics Reliability
Contributions from the European ECSEL JU project iRel40
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Beschreibung
This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
- Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices;
- Discusses how to correlate electronic processing and performance to reliability and lifetime;
- Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices.
This book describes the latest progress in reliability analysis of microelectronic products. The content grows out of an EU project, named Intelligent Reliability 4.0 - iRel40 (see www.irel40.eu ). Different industrial sectors and topics are covered, such as electronics in automotive, rail transport, lighting and personal appliances. Several case studies and examples are discussed, which will enable readers to assess and mitigate similar failure cases. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
Describes state-of-the-art methodologies for analyzing the reliability, failure, and degradation of electronic devices Discusses how to correlate electronic processing and performance to reliability and lifetime Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of electronic devices
Autor*in
Willem Dirk van Driel
Themen in »Recent Advances in Microelectronics Reliability«
Reliability of Electrical and Electronic Systems Reliability and failure of microelectronics life assessment methodologies for electronics degradation of electronic devices electronics health monitoring