VLSI Design and Test

Beschreibung

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

Autor*in

Ambika Prasad Shah

Themen in »VLSI Design and Test«

bandwidth communication channels (information theory) communication systems computer hardware computer networks computer systems computer vision Computer-Aided Design (CAD) engineering Field Programmable Gate Array (FPGA) mathematics microprocessor chips network protocols signal processing signal to noise ratio

Stimmen zu »VLSI Design and Test«

Details

Link teilen