Noise Contamination in Nanoscale VLSI Circuits
Buch in deiner Nähe kaufen
Beschreibung
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Offers comprehensive, textbook coverage of all major noise mechanisms affecting nanometer VLSI circuits Covers power supply noise in on-chip power and ground distribution networks and its impact on circuit performance Highlights impact of noise on chip timing and functionality and on clock networks
Autor*in
Selahattin Sayil
Themen in »Noise Contamination in Nanoscale VLSI Circuits«
CMOS Design & Reliability textbook VLSI Design for Reliability textbook VLSI Noise textbook Interconnect Noise Radiation Induced Soft Error