Thin Films
Processes and Characterization Techniques
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Beschreibung
The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials’ physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies.
- Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition;
- Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization;
- Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials’ physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies.
Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement Highlights the correlation of optical and chemical properties obtained from spectroscopic methods
Autor*in
Nicoleta Nedelcu
Themen in »Thin Films«
Thin films materials characterization materials processing thermal evaporation Chemical vacuum deposition UV-Vis Spectroscopy FT-IR Raman Spectroscopy Microscopy techniques Spectro-ellipsometry