van Driel Reliability of Organic Compounds in Microelectronics and Optoelectronics

Reliability of Organic Compounds in Microelectronics and Optoelectronics

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From Physics-of-Failure to Physics-of-Degradation

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Beschreibung

This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.



This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.


Provides an overview of different failure mechanisms in different organic materials Presents methodologies for analysing the reliability, failure, and degradation of different organic materials Explains how to correlate product performance and reliability to materials degradation

Autor*in

Willem Dirk van Driel

Themen in »Reliability of Organic Compounds in Microelectronics and Optoelectronics«

Environmental Degradation of Materials Thermal Degradation of Polymer Blends Reliability and failure of microelectronic materials life assessment methodologies Electromigration-induced failures Creep failures

Stimmen zu »Reliability of Organic Compounds in Microelectronics and Optoelectronics«

Details

ISBN: 9783030815752
Verlag: Springer International Publishing
Erscheinung: 01.02.2022

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