Torsello Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

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Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings

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Beschreibung

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.


Autor*in

Andrea Torsello

Themen in »Structural, Syntactic, and Statistical Pattern Recognition«

artificial intelligence computer networks computer science computer systems computer vision directed graphs education engineering graph theory image analysis image processing image segmentation internet learning machine learning

Stimmen zu »Structural, Syntactic, and Statistical Pattern Recognition«

Details

ISBN: 9783030739720
Verlag: Springer International Publishing
Erscheinung: 10.04.2021

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