Earl J. Kirkland Kirkland Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy

von Earl J. Kirkland

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Beschreibung

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.


This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Features in-depth coverage of numerical computation of electron microscopy images including multislice methods Covers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade Includes updated appendices with code in Octave Allows you to calculate images from first principles for specimens ranging from simple inorganic crystals to cryo-EM biological specimens

Autor*in

Earl J. Kirkland

Themen in »Advanced Computing in Electron Microscopy«

fast fourier projection theorem fast fourier transform multislice methods scanning transmission electron microscope theory of electron image formation transmission electron microscopy image interpretation parallel image processing ABF imaging Biological Microscopy

Stimmen zu »Advanced Computing in Electron Microscopy«

Details

ISBN: 9783030332600
Verlag: Springer International Publishing
Erscheinung: 09.03.2020

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