Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
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Beschreibung
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.
In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.
It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Presents the applications of Kelvin probe force microscopy in nanotechnology
Provides an in-depth description of a variety of theoretical and experimental aspects of the technique
Includes contributions by the leading experts in the field
Discusses the applications of Kelvin probe force microscopy in nanotechnology Provides a detailed description of a variety of theoretical and experimental aspects of the technique Includes contributions by leading experts in the field
Autor*in
Sascha Sadewasser
Themen in »Kelvin Probe Force Microscopy«
Scanning Kelvin Probe Microscopy Electrostatic Force Microscopy KPFM techniques for liquid environment KPFM with atomic resolution KPFM with atomic resolution electrostatic field of a cantilever Kelvin spectroscopy of single molecules