The Atomic Structure of Point Defects in semiconductors by improved EPR / ENDOR data analysis
Buch in deiner Nähe kaufen
oder
Beschreibung
Autor*in
Frank Wirbeleit
Themen in »The Atomic Structure of Point Defects in semiconductors by improved EPR / ENDOR data analysis«
Stimmen zu »The Atomic Structure of Point Defects in semiconductors by improved EPR / ENDOR data analysis«
Details
ISBN: 9783000234446
Verlag: buero-frank
Erscheinung: 12.2009