Failure Analysis
High Technology Devices
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Beschreibung
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Autor*in
Daniel J. D. Sullivan
Themen in »Failure Analysis«
Analytical Techniques High Technology Devices Failure Analysis.
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Details
ISBN: 9781501516474
Verlag: Walter de Gruyter
Erscheinung: 24.10.2022