Yongke Sun Scott E. Thompson Toshikazu Nishida Sun Strain Effect in Semiconductors

Strain Effect in Semiconductors

von Yongke Sun Scott E. Thompson Toshikazu Nishida

Theory and Device Applications

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Beschreibung

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also:

This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.

 


Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.
Provides industry relevant applications for strained CMOS technology Discusses range of applications from planar (2D) to nano-wire (1D) devices Treats strain physics at both qualitative overview level as well as detailed fundamental physics Explains strain physics relevant to logic devices as well as strain-based MEMS Sensors and strain in optoelectronic devices Includes supplementary material: sn.pub/extras

Autor*in

Yongke Sun

Themen in »Strain Effect in Semiconductors«

CMOS technology Semiconductor Sensor fundamental physics logic devices microelectromechanical system (MEMS) optoelectronic devices strain effect strain physics strain-based MEMS

Stimmen zu »Strain Effect in Semiconductors«

Details

ISBN: 9781489983152
Verlag: Springer US
Erscheinung: 20.11.2014

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