Atom-Probe Tomography
The Local Electrode Atom Probe
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Beschreibung
This book aims to provide an introduction and overview of atom-probe tomography from a materials science perspective, a full introduction to underlying theory and to current understanding of the theory of laser-pulsed APT, and a careful account of how to prepare specimens, set up the appropriate conditions for tomography, analyse the experimental data, and present results.
A special feature of this book is that it includes an updated historical account of the development of the underlying theory (including field evaporation), allowing readers to appreciate how theoretical understanding of the science behind the technique reached its present state.
This book is ideal for:
· beginners as well as more experienced researchers and scientists
· those interested mainly in using the pulsed-laser local electrode atom probe for materials science
· those interested in developing the technique and understanding the details of how it works
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Serves as a practical guide for the operation of the technique and analysis of the data Covers state-of-the-art instrumentation and theories Includes new and revised data analysis methods and applications Includes supplementary material: sn.pub/extras
Autor*in
Michael K. Miller
Themen in »Atom-Probe Tomography«
FIB-based methods atom probe tomography decomposition electropolishing field emission field ionization laser pulsing methods metallurgy microanalysis microscopy microstructural characterization phase separation semiconductors