John B. Newkirk Gavin R. Mallett Newkirk Advances in X-Ray Analysis

Advances in X-Ray Analysis

von John B. Newkirk Gavin R. Mallett

Volume 10

Preis unbekannt

Buch in deiner Nähe kaufen


...oder deine aktuelle Postleitzahl eingeben:
oder

Beschreibung

The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

Autor*in

John B. Newkirk

Themen in »Advances in X-Ray Analysis«

Atom Gold Magnesium Nickel Titan X-ray alloy crystal crystallography diffraction electron fatigue interferometry liquid microscopy

Stimmen zu »Advances in X-Ray Analysis«

Details

ISBN: 9781468478372
Verlag: Springer US
Erscheinung: 12.06.2012

Link teilen


Über buchnah.de | Die Buchhandlungen | Die Verlage | Impressum & Kontakt | Datenschutz | Presse


Auf dieser Seite kannst Du Buchhandlungen in der Nähe finden