Circuit Design for Reliability
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Beschreibung
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
- Provides comprehensive review on various reliability mechanisms at sub-45nm nodes;
- Describes practical modeling and characterization techniques for reliability;
- Includes thorough presentation of robust design techniques for major VLSI design units;
- Promotes physical understanding with first-principle simulations.
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Provides comprehensive review on various reliability mechanisms at sub-45nm nodes Describes practical modeling and characterization techniques for reliability Includes thorough presentation of robust design techniques for major VLSI design units Promotes physical understanding with first-principle simulations Includes supplementary material: sn.pub/extras
Autor*in
Ricardo Reis
Themen in »Circuit Design for Reliability«
Embedded Systems Integrated Circuit Design Integrated Circuit Variability Reliable Integrated Circuits Robust Integrated Circuits quality control, reliability, safety and risk
Stimmen zu »Circuit Design for Reliability«
Details
ISBN: 9781461440789
Verlag: Springer US
Erscheinung: 08.11.2014