Yu Cao Cao Predictive Technology Model for Robust Nanoelectronic Design

Predictive Technology Model for Robust Nanoelectronic Design

von Yu Cao

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Beschreibung

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling. 
Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks Includes a complete and quantitative vision on the opportunities and limits of technology scaling toward the 10nm regime Addresses the emergent modeling and design needs under ever-increasing variability and reliability concerns Covers state-of-the-art compact modeling solutions for CMOS alternatives and post-silicon devices, enabling exploratory design activities beyond traditional CMOS Discusses the seamless integration of the process/materials development and circuit simulation that supports concurrent technology-design research Includes supplementary material: sn.pub/extras

Autor*in

Yu Cao

Themen in »Predictive Technology Model for Robust Nanoelectronic Design«

Circuit performance analysis Device and circuit reliability Device modeling Electronic design automation Low power design Nanoelectronic design Predictive modeling Process variability Technology scaling

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Details

ISBN: 9781461404446
Verlag: Springer US
Erscheinung: 12.07.2011

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