Design, Automation, and Test in Europe
The Most Influential Papers of 10 Years DATE
Buch in deiner Nähe kaufen
Beschreibung
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
The papers were grouped in six sections:
System Level Design;
Networks on Chip;
Modeling, Simulation and Run-Time Management;
Digital Systems in CMOS and Beyond;
Physical Design and Validation; and
Test and Verification.
The winners of the prestigious EDAA Lifetime Achievement Award as well as other recognized experts in their field wrote an introduction to each section, summarizing the history in their domain and indicating how the selected DATE papers contributed to it.
The Design Automation and Test in Europe, DATE, is Europe’s leading international electronic systems design conference for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. It combines the conference with Europe’s leading international ex- bition for electronic design, automation and test. To celebrate the tenth anniversary of DATE, we have compiled this book with the aim to highlight some of the most influential technical contributions from ten years of DATE. Selecting 30 papers, only 3 papers from each year, is a challenging endeavor. Although the impact of papers from the first years of DATE can be det- mined through various citation indexes, the impact from the later years still have to be seen. Together with all 10 Program Chairs, we have made a selection of the most influential papers covering the very broad range of topics which is characteristic for DATE.
Comprehensive historical overview of the evolutions in the last 10 years in the field of design, automation and test Contains the most influential papers selected from Europe’s most important conference on Design, Automation and Test (DATE) Most influential papers placed into historical context by recognized experts
Autor*in
Rudy Lauwereins
Themen in »Design, Automation, and Test in Europe«
CMOS Embedded System IEEE 80 circuit compiler digital system electronics embedded systems interconnect network on chip (NoC) optimization power management router routing simulation