Velazco Radiation Effects on Embedded Systems

Radiation Effects on Embedded Systems

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Beschreibung

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.


Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.


Provides an extensive overview of radiation effects on integrated circuits Coverage of space radiation effects Design hardening methodologies Simulation techniques of the transient effects of radiation on integrated circuits Methodology and tools for radiation ground testing on circuits and systems Qualification of circuits and systems for space applications

Autor*in

Raoul Velazco

Themen in »Radiation Effects on Embedded Systems«

Radiation Effects Radiation ground testing Signal analog circuit electronics embedded systems fault tolerance integrated circuit laser microelectronics single event effects single-electron transistor software testing

Stimmen zu »Radiation Effects on Embedded Systems«

Details

ISBN: 9781402056468
Verlag: Springer Netherland
Erscheinung: 19.06.2007

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