Secondary Ion Mass Spectrometry
An Introduction to Principles and Practices
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Beschreibung
Serves as a practical reference for those involved in Secondary IonMass Spectrometry (SIMS)
* Introduces SIMS along with the highly diverse fields(Chemistry, Physics, Geology and Biology) to it is applied using upto date illustrations
* Introduces the accepted fundamentals and pertinentmodels associated with elemental and molecular sputtering and ionemission
* Covers the theory and modes of operation of theinstrumentation used in the various forms of SIMS (Static vsDynamic vs Cluster ion SIMS)
* Details how data collection/processing can be carriedout, with an emphasis placed on how to recognize and avoid commonlyoccurring analysis induced distortions
* Presented as concisely as believed possible with Allsections prepared such that they can be read independently of eachother
Autor*in
Paul van der Heide
Themen in »Secondary Ion Mass Spectrometry«
Analytical Chemistry Analytische Chemie Chemie Chemistry Dünne Schichten, Oberflächen u. Grenzflächen Electrical & Electronics Engineering Elektrotechnik u. Elektronik Halbleiter Massenspektrometrie Materials Science Materialwissenschaften Semiconductors Thin Films, Surfaces & Interfaces
Stimmen zu »Secondary Ion Mass Spectrometry«
"It is well worth owning if you want to learn about this exciting surface science technique for studying materials." (IEEE Electrical Engineering magazine, 1 May 2015)
"The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method." (Anal Bioanal Chem, 21 February 2015)
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