Secondary Ion Mass Spectrometry

Beschreibung

Secondary Ion Mass Spectrometry (SIMS) has become an indispensible, fully commercialized micro-analytical technique applied in a diverse range of fields spanning the Materials Sciences, Earth sciences and Bio-Sciences with new application field continually being uncovered. This book provides a pedagogic function as well as a research tool to anyone involved in any of these forms of SIMS (senior undergraduates through seasoned professionals within academia or industry). This book does so by supplying a clear and definitive introduction to: a) The fundaments of sputtering and secondary ion formation/survival inclusive of pertinent models for elemental and molecular emission b) Both the theory and application, inclusive of modes of operation, of the latest instrumentation used in Static SIMS, Dynamic SIMS or Cluster SIMS c) Data collection and processing protocols along with reasons for any distortions that can be introduced Amalgamation of theory with experimental data from a practitioner's perspective is the core feature of this book. This is aided through the use of numerous illustrations from highly diverse fields are included. All sections are prepared such that each can be read independently of each other. Commonly used reference tables, review questions, vendors and contacts and descriptions of related techniques presented in the Appendix.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) * Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations * Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission * Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) * Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions * Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Autor*in

Paul van der Heide

Themen in »Secondary Ion Mass Spectrometry«

Analytical Chemistry Analytische Chemie Chemie Chemistry Dünne Schichten, Oberflächen u. Grenzflächen Electrical & Electronics Engineering Elektrotechnik u. Elektronik Halbleiter Massenspektrometrie Materials Science Materialwissenschaften Semiconductors Thin Films, Surfaces & Interfaces

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"The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method." (Anal Bioanal Chem, 21 February 2015)
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