Atomic Force Microscopy
Understanding Basic Modes and Advanced Applications
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Beschreibung
This book enlightens readers on the basic surfaceproperties and distance-dependent intersurface forces one mustunderstand to obtain even simple data from an atomic forcemicroscope (AFM). The material becomes progressively more complexthroughout the book, explaining details of calibration, physicalorigin of artifacts, and signal/noise limitations. Coverage spansimaging, materials property characterization, in-liquid interfacialanalysis, tribology, and electromagnetic interactions.
"Supplementary material for this book can be found byentering ISBN 9780470638828 on booksupport.wiley.com"
Autor*in
Greg Haugstad
Themen in »Atomic Force Microscopy«
Chemie Chemistry Microscopy Mikroskopie Nanophysics Nanophysik Nanotechnologie Nanotechnology