Manoj Sachdev Sachdev Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

von Manoj Sachdev

Preis unbekannt

Buch in deiner Nähe kaufen


...oder deine aktuelle Postleitzahl eingeben:
oder

Beschreibung

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate.
Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives.
Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field.

`A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.'
... from the Foreword by Vishwani D. Agrawal

Autor*in

Manoj Sachdev

Themen in »Defect Oriented Testing for CMOS Analog and Digital Circuits«

CMOS Programmable Logic analog circuit design integrated circuit logic model modeling stability

Stimmen zu »Defect Oriented Testing for CMOS Analog and Digital Circuits«

Details

ISBN: 9780792380832
Verlag: Springer US
Erscheinung: 31.12.1997

Link teilen


Über buchnah.de | Die Buchhandlungen | Die Verlage | Impressum & Kontakt | Datenschutz | Presse


Auf dieser Seite kannst Du Buchhandlungen in der Nähe finden