X-Ray Optics and Microanalysis

Beschreibung

ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Autor*in

Melissa A. Denecke

Themen in »X-Ray Optics and Microanalysis«

ICXOM20 X-ray microscopy microprobe research x-ray optic developers x-ray optics and nano-analysis

Stimmen zu »X-Ray Optics and Microanalysis«

Details

Link teilen