Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

Beschreibung

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

Autor*in

P.M. Koenraad

Themen in »Scanning Tunneling Microscopy/Spectroscopy and Related Techniques«

Atomic Force Microscopy AFM Magnetic Force Microscopy MFM Manipulation of single atoms and biological structures Nanotechnology Scanning Probe Microscopy SPM Scanning Tunneling Microscopy STM Surface Analysis

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