Stress Induced Phenomena in Metallization

Beschreibung

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.

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Shefford P. Baker

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Computer chip manufacturing and quality control development of integrated circuits microelectromechanical devices research in reliability problems of electronic devices

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