Prelec Electron Beam Ion Sources and Traps and Their Applications

Electron Beam Ion Sources and Traps and Their Applications

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8th International Symposium EBIS/T 2000, Upton, New York, 5-8 November 2000

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Beschreibung

This symposium is a triennial event, held in different places around the world (next symposium will be in Japan, in 2003). The topic of the symposium is the development of electron beam ion sources and traps and their applications, so far in basic science and research, but with prospects for extending them into other areas. Potential readers would have an interest in atomic physics and applications to accelerator physics.

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Krsto Prelec

Themen in »Electron Beam Ion Sources and Traps and Their Applications«

Atomphysik Beam instrumentation atomic accelerators atomic physics electron ion beams elektrische Ionenstrahlen

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Details

ISBN: 9780735400115
Verlag: AIP Press
Erscheinung: 01.08.2001

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