Rik Brydson Brydson Aberration-corrected Analytical Electron Microscopy

Aberration-corrected Analytical Electron Microscopy

von Rik Brydson

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Beschreibung

Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. This book presents the background and implementation of techniques which have allowed true imaging and chemical analysis at the scale of single atoms as applied to the fields of materials science and nanotechnology. Edited and written by the founders of the world's first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text: * Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes * Is based on an established course taught at postgraduate summer schools by leaders in this field. * Is essential reading for researchers involved in the analysis of materials at the nanoscale Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Autor*in

Rik Brydson

Themen in »Aberration-corrected Analytical Electron Microscopy«

Chemie Chemistry Elektronenmikroskopie Microscopy Mikroskopie Optics & Photonics Optik u. Photonik Physics Physik

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Details

ISBN: 9780470518519
Verlag: John Wiley & Sons
Erscheinung: 23.09.2011

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