Emerging Nanotechnologies
Test, Defect Tolerance, and Reliability
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Beschreibung
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Covers various technologies that have been suggested by researchers over the last decades Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubes Discusses different aspects of test and defect tolerance for crossbar-based nanoscale devices Contains five chapters focusing on test, defect tolerance and reliability for QCA circuits Presents methods for testing and diagnosis of realistic defects in digital microfluidic biochips Includes three chapters dealing with the reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits Includes supplementary material: sn.pub/extras
Autor*in
Mohammad Tehranipoor
Themen in »Emerging Nanotechnologies«
CMOS Nanotechnologie Nanotube Technologie carbon nanotubes circuit design diagnosis logic nanotechnology optimization planning reliability technology testing