Statistical Analysis and Optimization for VLSI: Timing and Power

Beschreibung

Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement.

Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.

Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. Included is the necessary mathematical background on techniques which find widespread use in current analysis and optimization. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. The authors also describe recent optimization approaches to timing yield and contrast them to deterministic optimization. The work will enable new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. It focuses on timing and power analysis techniques, developed during the past couple of years, which will lead to parametric yield analysis techniques. Optimization approaches suitable in non-deterministic scenarios which improve the yield of the design are also explained. This book comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. The authors have been leading a lot of the research in this area and will also provide novel ideas and approaches to handle the addressed issues.

Autor*in

Ashish Srivastava

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VLSI algorithms computer computer-aided design (CAD) design design process development modeling optimization research silicon statistical analysis

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